Optimal Pareto Solutions of a Dynamic C Chart: An Application of Statistical Process Control on a Semiconductor Devices Manufacturing Process
- 1 Dipartimento di Ingegneria Chimica, Gestionale, Informatica, Meccanica (DICGIM), Italy
- 2 Department of Agricultural and Forest Sciences, Università degli Studi di Palermo, 90128 Palermo, Italy
Abstract
The present paper proposes a novel economic-statistical design procedure of a dynamic c control chart for the Statistical Process Control (SPC) of the manufacturing process of semiconductor devices. Particularly, a non-linear constrained mathematical programming model is formulated and solved by means of the ϵ-constraint method. A numerical application is developed in order to describe the Pareto frontier, that is the set of optimal c charts and the related practical considerations are given. The obtained results highlight how the performance of the developed dynamic c chart overcome that of the related static one, thus demonstrating the effectiveness of the proposed procedure.
DOI: https://doi.org/10.3844/ajassp.2015.254.261
Copyright: © 2015 Toni Lupo and Filippo Sgroi. This is an open access article distributed under the terms of the
Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
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Keywords
- Statistical Process Control
- Dynamic C Chart
- Multi-Objective Design
- ε-Constraint Method
- Semiconductor Devices Manufacturing