American Journal of Applied Sciences

Seismic Refraction Method: A Technique for Determining the Thickness of Stratified Substratum

Ochuko Anomohanran

DOI : 10.3844/ajassp.2013.857.862

American Journal of Applied Sciences

Volume 10, Issue 8

Pages 857-862


The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics. This is why this study was carried out to emphasize the ability of the seismic refraction method in determining the thickness of stratified layers of soil and rock. The results obtained are generalized expressions that relate travel time, offset distance, velocity and thickness of subsurface layers.


© 2013 Ochuko Anomohanran. This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.