Effect of Film thickness on the Electrical and Structural Properties of CdS: In Thin Films
Shadia J. Ikhmayies and Riyad N. Ahmad-Bitar
DOI : 10.3844/ajassp.2008.1141.1143
American Journal of Applied Sciences
Volume 5, Issue 9
Polycrystalline CdS:In thin films were prepared by the Spray Pyrolysis (SP) technique on glass substrates at a substrate temperature Ts= 490Â°C. The effect of film thickness on the electrical and structural properties of the films was investigated through the analysis of the I-V plots, x-ray diffraction spectra (XRD) and the scanning electron microscope (SEM) images. The conductivity of the films was highly increased when the films became thicker. The crystal growth became stronger and more oriented as seen in the x-ray diffraction spectra and the grain size became larger as seen in the SEM images.
© 2008 Shadia J. Ikhmayies and Riyad N. Ahmad-Bitar. This is an open access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.