Research Article Open Access

Deposition and Characterization of CdS Nano Thin Film with Complexing Agent Triethanolamine

K. Manikandan1, C. Surendra Dilip2, P. Mani2 and J. Joseph Prince2
  • 1 Government College of Engineering Srirangam, India
  • 2 Anna University BIT Campus, India
American Journal of Engineering and Applied Sciences
Volume 8 No. 3, 2015, 318-327

DOI: https://doi.org/10.3844/ajeassp.2015.318.327

Submitted On: 28 January 2015 Published On: 1 June 2015

How to Cite: Manikandan, K., Dilip, C. S., Mani, P. & Prince, J. J. (2015). Deposition and Characterization of CdS Nano Thin Film with Complexing Agent Triethanolamine. American Journal of Engineering and Applied Sciences, 8(3), 318-327. https://doi.org/10.3844/ajeassp.2015.318.327

Abstract

The equimolar concentration thin films of Cadmium Sulfide (CdxSx) with the complexing agent TEA were deposited on a glass substrate by the SILAR technique. The crystalline nature with face centered cubic crystal system of the CdS films is determined from X-ray diffraction analysis. The broadened diffraction peaks indicated nano sized particles of the film materials. The surface morphology of the films was studied by SEM analysis. The Energy Dispersive Analysis of X-ray (EDAX) plot confirms the equimolar composition of Cd and S ions in the film materials. Surface topography of the film was studied by AFM. The optical characteristic of absorbance, transmittance and band gap was analyzed by UV-visible spectra. The band gap energy of the material was observed as 2.18 eV and chemical bonding was studied by FT-IR spectral analysis.

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Keywords

  • Optical Material
  • Semiconductors
  • Surfaces
  • Thin Films