Research Article Open Access

Low Transition Test Pattern Generator Architecture for Built-in-Self-Test

P. Sakthivel1, A. NirmalKumar2 and T. Mayilsamy3
  • 1 Velalar College of Engineering and Technology, India
  • 2 , India
  • 3 Velalar College of Engineering and Technology , India
American Journal of Applied Sciences
Volume 9 No. 9, 2012, 1396-1406

DOI: https://doi.org/10.3844/ajassp.2012.1396.1406

Submitted On: 16 May 2012 Published On: 21 July 2012

How to Cite: Sakthivel, P., NirmalKumar, A. & Mayilsamy, T. (2012). Low Transition Test Pattern Generator Architecture for Built-in-Self-Test. American Journal of Applied Sciences, 9(9), 1396-1406. https://doi.org/10.3844/ajassp.2012.1396.1406

Abstract

Problem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need long test time. Approach: This study presents a novel test pattern generation technique called Low-Transition Generalized Linear Feedback Shift Register (LT-GLFSR) with bipartite (half fixed) and bit insertion (either 0 or 1) techniques. Intermediate patterns (by bipartite and bit (either 0 or 1) insertion technique) inserted in between consecutive test patterns generated by GLFSR which is enabled by a non overlapping clock scheme. This process is performed by finite state machine generate sequence of control signals. Low-Transition Generalized Linear Feedback Shift Registers (LT-GLFSR), are used in a circuit under test to reduce the average and peak power during transitions. LT-GLFSR patterns high degree of randomness and correlation between consecutive patterns. LT-GLFSR does not depend on circuit under test and hence it is used for both BIST and scan-based BIST architectures. Results and Conclusion: Simulation results prove that this technique has reduction in power consumption and high fault coverage with minimum number of test patterns. The results also show that it reduces the peak and average power consumption during test for ISCAS’89 bench mark circuits.

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Keywords

  • As Linear Feedback Shift Registers (LFSRs)
  • Circuit-Under-Test (CUT)
  • Design-For-Testability (DFT)
  • Automatic Test Equipment (ATE)
  • Built-In Self-Test (BIST)