Research Article Open Access

Applying Fuzzy Analytic Hierarchy Process and Grey Relation Analysis to Evaluate the Supply Chain Performance of the Wafer Testing House

Yun-Chin Chen1, Jun-Yuan Kuo2 and Bang-Ting Luo3
  • 1 Department of Business Administration, De Lin Institute of Technology, No.1, Ln. 380, Qingyun Rd., Tucheng Dist, New Taipei City 236, (ROC), Taiwan
  • 2 Department of International Business, Kainan University, Taiwan
  • 3 Department of International Business, Kainan University, No.1 Kainan Road, Luzhu Shiang, Taoyuan 338, (R.O.C), Taiwan

Abstract

Problem statement: In the information age, the process of E-Commerce (EC) operates quickly and the present enterprises of Taiwan have to face the Free Cross-Strait Market (FCSM) with Mainland China, which will definitely change the model as well as the performance of the supply chain. Hence, this study focuses on the issue of supply chain performance evaluation of the wafer testing house in Taiwan. Approach: This investigation applied the Fuzzy Analytic Hierarchy Process (FAHP) to derive the weights of influential indicators for evaluating the supply chain performance of the wafer testing house and the Grey Relation Analysis (GRA) was used to evaluate the performance between the FCSM and EC aspects. Results: The analyzed results had identified the indicator weight of the supply chain performance evaluation in the wafer testing house and the indicator performances between different aspects were compared. The research results indicated that the FCSM aspect had better performance than EC aspect of the supply chain evaluation in the wafer testing house. Conclusion/Recommendations: Based on the analyzed results, the managers can find out the problems and improve the supply chain performance of the wafer testing house. This study not only can be a good basis for improvements of the case company, but also can be the reference for evaluating the supply chain performance of the wafer testing house.

American Journal of Applied Sciences
Volume 8 No. 12, 2011, 1398-1403

DOI: https://doi.org/10.3844/ajassp.2011.1398.1403

Submitted On: 17 September 2011 Published On: 27 October 2011

How to Cite: Chen, Y., Kuo, J. & Luo, B. (2011). Applying Fuzzy Analytic Hierarchy Process and Grey Relation Analysis to Evaluate the Supply Chain Performance of the Wafer Testing House. American Journal of Applied Sciences, 8(12), 1398-1403. https://doi.org/10.3844/ajassp.2011.1398.1403

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Keywords

  • Fuzzy analytic hierarchy process
  • grey relation analysis
  • supply chain management
  • wafer testing house
  • performance evaluation
  • fuzzy theory
  • E-Commerce (EC)